Combining Fdtd Simulations with Measurements of Microstrip Ring Resonators for Characterization of Low- and High-k Dielectrics at Microwaves
نویسندگان
چکیده
This paper shows how the dielectric constant of alumina and rutile substrates at microwa e frequencies can be accurately determined by fitting the simulated S-parameter spectra of microstrip ring ( ) resonators, generated ia the finite-difference time-domain FDTD method, to experimentally measured data. The proposed method does not require the determination of the effecti e dielectric constant and the approximate closed-form expressions to find the true permitti ity of the substrate. This is essential for the characterization of high-K dielectric materials at high frequencies when the closed-form expressions are in alid. 2001 John Wiley & Sons, Inc. Microwave Opt Technol Lett 29: 21 24, 2001.
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